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Observation of strain field fluctuation in SiGe-relaxed buffer layers and its influence on overgrown structures
Observation of strain field fluctuation in SiGe-relaxed buffer layers and its influence on overgrown structures
Observation of strain field fluctuation in SiGe-relaxed buffer layers and its influence on overgrown structures
Sawano, K. (author) / Usami, N. (author) / Arimoto, K. (author) / Koh, S. (author) / Nakagawa, K. (author) / Shiraki, Y. (author)
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING ; 8 ; 177-180
2005-01-01
4 pages
Article (Journal)
English
DDC:
621.38152
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