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Photo-electron emission and atomic force microscopies of the hydrogen etched 6H-SiC(0001) surface and the initial growth of GaN and AlN
Photo-electron emission and atomic force microscopies of the hydrogen etched 6H-SiC(0001) surface and the initial growth of GaN and AlN
Photo-electron emission and atomic force microscopies of the hydrogen etched 6H-SiC(0001) surface and the initial growth of GaN and AlN
Hartman, J. D. (Autor:in) / Naniwae, K. (Autor:in) / Petrich, C. (Autor:in) / Nemanich, R. J. (Autor:in) / Davis, R. F. (Autor:in)
APPLIED SURFACE SCIENCE ; 242 ; 428-436
01.01.2005
9 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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