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TEM and ellipsometry studies of nanolaminate oxide films prepared using atomic layer deposition
TEM and ellipsometry studies of nanolaminate oxide films prepared using atomic layer deposition
TEM and ellipsometry studies of nanolaminate oxide films prepared using atomic layer deposition
Mitchell, D. R. (Autor:in) / Attard, D. J. (Autor:in) / Finnie, K. S. (Autor:in) / Triani, G. (Autor:in) / Barbe, C. J. (Autor:in) / Depagne, C. (Autor:in) / Bartlett, J. R. (Autor:in)
APPLIED SURFACE SCIENCE ; 243 ; 267-279
01.01.2005
13 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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