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J-V Characteristics of Al^+ Ion Implanted p^+/n 4H-SiC Diodes Annealed in Silane Ambient at 1600^oC
J-V Characteristics of Al^+ Ion Implanted p^+/n 4H-SiC Diodes Annealed in Silane Ambient at 1600^oC
J-V Characteristics of Al^+ Ion Implanted p^+/n 4H-SiC Diodes Annealed in Silane Ambient at 1600^oC
Bergamini, F. (Autor:in) / Rao, S. P. (Autor:in) / Saddow, S. E. (Autor:in) / Nipoti, R. (Autor:in) / Nipoti, R. / Poggi, A. / Scorzoni, A.
01.01.2005
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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