Hydrogen-Induced Defects of Subsurface Layer in ZnO Single Crystal Probed by a Slow Positron Beam

Xue, X.D. / Wang, T. / Jiang, J. et al. | British Library Online Contents | 2013

Defect Property in He^+ Implanted Silicon Probed by Slow Positron Beam

Zhou, X. Y. / Zhang, T. H. / Zhang, X. F. et al. | British Library Online Contents | 2001

Positron annihilation in SiO2-Si studied by a pulsed slow positron beam

Suzuki, R. / Ohdaira, T. / Uedono, A. et al. | British Library Online Contents | 2002

Vacancy-Type Defects in SrTiO~3 Probed by a Monoenergetic Positron Beam

Uedono, A. / Kiyohara, M. / Shimoyama, K. et al. | British Library Online Contents | 2004

Depth Dependence of Defects in Ion-Implanted Si Probed by a Positron Beam

Fujinami, M. / Miyagoe, T. / Sawada, T. et al. | British Library Online Contents | 2004