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Structural defects in SiO2/SiC interface probed by a slow positron beam
Structural defects in SiO2/SiC interface probed by a slow positron beam
Structural defects in SiO2/SiC interface probed by a slow positron beam
Maekawa, M. (author) / Kawasuso, A. (author) / Chen, Z. Q. (author) / Yoshikawa, M. (author) / Suzuki, R. (author) / Ohdaira, T. (author)
APPLIED SURFACE SCIENCE ; 244 ; 322-325
2005-01-01
4 pages
Article (Journal)
English
DDC:
621.35
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