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High-voltage electron-microscopical observation of crack-tip dislocations in silicon crystals
High-voltage electron-microscopical observation of crack-tip dislocations in silicon crystals
High-voltage electron-microscopical observation of crack-tip dislocations in silicon crystals
Tanaka, M. (author) / Higashida, K. (author)
MATERIALS SCIENCE AND ENGINEERING A ; 400-401 ; 426-430
2005-01-01
5 pages
Article (Journal)
English
DDC:
620.11
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