Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Recrystallization Technology of a-Si:H Thin Films and Raman Spectra Analysis of Si Thin Films
Recrystallization Technology of a-Si:H Thin Films and Raman Spectra Analysis of Si Thin Films
Recrystallization Technology of a-Si:H Thin Films and Raman Spectra Analysis of Si Thin Films
Feng, T.-h. (Autor:in) / Zhang, Y.-x. (Autor:in) / Wang, H.-y. (Autor:in) / Jin, R.-m. (Autor:in) / Lu, J.-x. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING -HANGZHOU- ; 23 ; 462-465
01.01.2005
4 pages
Aufsatz (Zeitschrift)
Unbekannt
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Structure and electronic states in a-Si:H thin films
| British Library Online Contents | 2012
Mechanical stress reduction in PECVD a-Si:H thin films
| British Library Online Contents | 1999
Nanostructural features of nc-Si:H thin films prepared by PECVD
| British Library Online Contents | 2004
Amorphous and nc-Si:H Intrinsic Thin Films for Solar Cells Applications
| British Library Online Contents | 2010
Microstructure and Thermal Features of a-Si:H and nc-Si:H Thin Films Produced by Rf Sputtering
| British Library Online Contents | 2006