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Recrystallization Technology of a-Si:H Thin Films and Raman Spectra Analysis of Si Thin Films
Recrystallization Technology of a-Si:H Thin Films and Raman Spectra Analysis of Si Thin Films
Recrystallization Technology of a-Si:H Thin Films and Raman Spectra Analysis of Si Thin Films
Feng, T.-h. (author) / Zhang, Y.-x. (author) / Wang, H.-y. (author) / Jin, R.-m. (author) / Lu, J.-x. (author)
MATERIALS SCIENCE AND ENGINEERING -HANGZHOU- ; 23 ; 462-465
2005-01-01
4 pages
Article (Journal)
Unknown
DDC:
620.11
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