Defects in He^+ Irradiated 6H-SiC Probed by DLTS and LTPL Measurements

Ruggiero, A. / Libertino, S. / Mauceri, M. et al. | British Library Online Contents | 2004

DLTS analysis of nickel-hydrogen complex defects in silicon

Shiraishi, M. / Sachse, J.-U. / Lemke, H. et al. | British Library Online Contents | 1999

DLTS studies of irradiation-induced defects in p-type germanium

Christian Petersen, M. / Lindberg, C. E. / Nielsen, K. B. et al. | British Library Online Contents | 2006

High Resolution DLTS Studies of Transition-Metal-Related Defects in Silicon

Dobaczewski, L. / Kaminski, P. / Kozlowski, R. et al. | British Library Online Contents | 1995

Influence of Growth Rate and C/Si-Ratio on the Formation of Point and Extended Defects in 4H-SiC Homoepitaxial Layers Investigated by DLTS

Zippelius, B. / Krieger, M. / Weber, H.B. et al. | British Library Online Contents | 2009