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Defects in He^+ Irradiated 6H-SiC Probed by DLTS and LTPL Measurements
Defects in He^+ Irradiated 6H-SiC Probed by DLTS and LTPL Measurements
Defects in He^+ Irradiated 6H-SiC Probed by DLTS and LTPL Measurements
Ruggiero, A. (Autor:in) / Libertino, S. (Autor:in) / Mauceri, M. (Autor:in) / Reitano, R. (Autor:in) / Musumeci, P. (Autor:in) / Roccaforte, F. (Autor:in) / La Via, F. (Autor:in) / Calcagno, L. (Autor:in)
MATERIALS SCIENCE FORUM ; 457/460 ; 493-496
01.01.2004
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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