Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Temperature-controlled depth profiling in polymeric materials using cluster secondary ion mass spectrometry (SIMS)
Temperature-controlled depth profiling in polymeric materials using cluster secondary ion mass spectrometry (SIMS)
Temperature-controlled depth profiling in polymeric materials using cluster secondary ion mass spectrometry (SIMS)
Mahoney, C. M. (Autor:in) / Fahey, A. J. (Autor:in) / Gillen, G. (Autor:in) / Xu, C. (Autor:in) / Batteas, J. D. (Autor:in)
APPLIED SURFACE SCIENCE ; 252 ; 6502-6505
01.01.2006
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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