A platform for research: civil engineering, architecture and urbanism
A platform for research: civil engineering, architecture and urbanism
Temperature-controlled depth profiling in polymeric materials using cluster secondary ion mass spectrometry (SIMS)
Temperature-controlled depth profiling in polymeric materials using cluster secondary ion mass spectrometry (SIMS)
Temperature-controlled depth profiling in polymeric materials using cluster secondary ion mass spectrometry (SIMS)
Mahoney, C. M. (author) / Fahey, A. J. (author) / Gillen, G. (author) / Xu, C. (author) / Batteas, J. D. (author)
APPLIED SURFACE SCIENCE ; 252 ; 6502-6505
2006-01-01
4 pages
Article (Journal)
English
DDC:
621.35
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