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RuO2/SiO2/Si and SiO2/porous Si/Si interfaces analysed by SIMS
RuO2/SiO2/Si and SiO2/porous Si/Si interfaces analysed by SIMS
RuO2/SiO2/Si and SiO2/porous Si/Si interfaces analysed by SIMS
Cwil, M. (Autor:in) / Konarski, P. (Autor:in) / Pajak, M. (Autor:in) / Bieniek, T. (Autor:in) / Kosinski, A. (Autor:in) / Kaczorek, K. (Autor:in)
APPLIED SURFACE SCIENCE ; 252 ; 7058-7061
01.01.2006
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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