RuO2/SiO2/Si and SiO2/porous Si/Si interfaces analysed by SIMS: Fid-Bau Portal

RuO2/SiO2/Si and SiO2/porous Si/Si interfaces analysed by SIMS

Cwil, M. / Konarski, P. / Pajak, M. / Bieniek, T. / Kosinski, A. / Kaczorek, K.

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RuO2/SiO2/Si and SiO2/porous Si/Si interfaces analysed by SIMS

Cwil, M. / Konarski, P. / Pajak, M. / Bieniek, T. / Kosinski, A. / Kaczorek, K.

RuO2/SiO2/Si and SiO2/porous Si/Si interfaces analysed by SIMS

Cwil, M. / Konarski, P. / Pajak, M. / Bieniek, T. / Kosinski, A. / Kaczorek, K.

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Document information

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Document information

Title:

RuO2/SiO2/Si and SiO2/porous Si/Si interfaces analysed by SIMS

Contributors:

Cwil, M. (author) / Konarski, P. (author) / Pajak, M. (author) / Bieniek, T. (author) / Kosinski, A. (author) / Kaczorek, K. (author)

Published in:

APPLIED SURFACE SCIENCE ; 252 ; 7058-7061

Publication date:

2006-01-01

Size:

4 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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