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Investigation into the nature of historical tapestries using time of flight secondary ion mass spectrometry (ToF-SIMS)

Batcheller, J. / Hacke, A. M. / Mitchell, R. / Carr, C. M.

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Investigation into the nature of historical tapestries using time of flight secondary ion mass spectrometry (ToF-SIMS)

Batcheller, J. / Hacke, A. M. / Mitchell, R. / Carr, C. M.

Investigation into the nature of historical tapestries using time of flight secondary ion mass spectrometry (ToF-SIMS)

Batcheller, J. / Hacke, A. M. / Mitchell, R. / Carr, C. M.

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Check availability in my library

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Document information

Title:

Investigation into the nature of historical tapestries using time of flight secondary ion mass spectrometry (ToF-SIMS)

Contributors:

Batcheller, J. (author) / Hacke, A. M. (author) / Mitchell, R. (author) / Carr, C. M. (author)

Published in:

APPLIED SURFACE SCIENCE ; 252 ; 7113-7116

Publication date:

2006-01-01

Size:

4 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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