Photoemission of 4H-SiC pin Diodes Epitaxied by the Sublimation Method

Camara, N. / Zekentes, K. / Bano, E. et al. | British Library Online Contents | 2006

Micro-Raman spectroscopy and X-ray diffraction studies of atomic-layer-deposited ZrO2 and HfO2 thin films

Tkachev, S. N. / Manghnani, M. H. / Niilisk, A. et al. | British Library Online Contents | 2005

X-ray Diffraction, Micro-Raman and Birefringence Imaging of Silicon Carbide

Pernot, E. / Mermoux, M. / Kreisel, J. et al. | British Library Online Contents | 2001

Comparative measurement of residual stress in diamond coatings by low-incident-beam-angle-diffraction and micro-Raman spectroscopy

Mohrbacher, H. / Van Acker, K. / Blanpain, B. et al. | British Library Online Contents | 1996

Diffraction from Crystals

Williams, David B. / Carter, C. Barry | Springer Verlag | 1996