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Investigation of Strain and Thin Film Relaxation in Ge~xSi~1~-~x/Si Strained-Layer Superlattice by Dark-Field Electron Holography
Investigation of Strain and Thin Film Relaxation in Ge~xSi~1~-~x/Si Strained-Layer Superlattice by Dark-Field Electron Holography
Investigation of Strain and Thin Film Relaxation in Ge~xSi~1~-~x/Si Strained-Layer Superlattice by Dark-Field Electron Holography
01.01.2012
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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