Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Microwave Dielectric Loss Characterization of Silicon Carbide Wafers
Microwave Dielectric Loss Characterization of Silicon Carbide Wafers
Microwave Dielectric Loss Characterization of Silicon Carbide Wafers
Bogart, T. (Autor:in) / Everson, B. (Autor:in) / Gamble, R. D. (Autor:in) / Oslosky, E. (Autor:in) / Synder, D. W. (Autor:in) / Furman, E. (Autor:in) / Perini, S. (Autor:in) / Lanagan, M. (Autor:in) / Devaty, R. P. / Larkin, D. J.
01.01.2006
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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