Resistivity Mapping of Semi-Insulating 6H-SiC Wafers

Roth, M. D. / Heydemann, V. D. / Mitchel, W. C. et al. | British Library Online Contents | 2002

Interface Defects of Bonded Silicon Wafers

Reiche, M. / Tong, Q.-Y. / Goesele, U. et al. | British Library Online Contents | 1995

Mapping of Defects in Large-Area Silicon Carbide Wafers via Photoluminescence and its Correlation with Synchrotron White Beam X-Ray Topography

Chen, Y. / Balaji, R. / Dudley, M. et al. | British Library Online Contents | 2009

Microwave Dielectric Loss Characterization of Silicon Carbide Wafers

Bogart, T. / Everson, B. / Gamble, R. D. et al. | British Library Online Contents | 2006

Damage-Free Surface Modification of Hexagonal Silicon Carbide Wafers

Chandler, T. C. / Lari, M. B. / Sudarshan, T. S. | British Library Online Contents | 2000