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High-performance and damage-free neutral-beam etching processes using negative ions in pulse-time-modulated plasma
High-performance and damage-free neutral-beam etching processes using negative ions in pulse-time-modulated plasma
High-performance and damage-free neutral-beam etching processes using negative ions in pulse-time-modulated plasma
Samukawa, S. (Autor:in)
APPLIED SURFACE SCIENCE ; 253 ; 6681-6689
01.01.2007
9 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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