Carrier Generation Lifetime in 4H-SiC Epitaxial Wafers

Chung, G.Y. / Loboda, M.J. / Marninella, M.J. et al. | British Library Online Contents | 2009

Minority Carrier Lifetime Measurements in 6H-SiC Using the Photoconductive Decay Technique

Zhou, W. / Khlebnikov, I. / Sudarshan, T. S. et al. | British Library Online Contents | 1998

Wafer Level Recombination Carrier Lifetime Measurements of 4H-SiC PiN Epitaxial Wafers

Chung, G.Y. / Loboda, M.J. / MacMillan, M.F. et al. | British Library Online Contents | 2009

Minority Carrier Lifetime Measurements in Specific Epitaxial 4H-SiC Layers by the Microwave Photoconductivity Decay

Ottaviani, L. / Palais, O. / Barakel, D. et al. | British Library Online Contents | 2009

Excess Carrier Lifetime Mapping for Bulk SiC Wafers by Microwave Photoconductivity Decay Method and Its Relationship with Structural Defect Distribution

Kato, M. / Ichimura, M. / Arai, E. et al. | British Library Online Contents | 2004