Carrier Lifetime Analysis by Microwave Photoconductive Decay (mu-PCD) for 4H SiC Epitaxial Wafers: Fid-Bau Portal

Carrier Lifetime Analysis by Microwave Photoconductive Decay (mu-PCD) for 4H SiC Epitaxial Wafers

Chung, G. Y. / Loboda, M. J. / MacMillan, M. F. / Wan, J. W. / Hansen, D. M.

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Carrier Lifetime Analysis by Microwave Photoconductive Decay (mu-PCD) for 4H SiC Epitaxial Wafers

Chung, G. Y. / Loboda, M. J. / MacMillan, M. F. / Wan, J. W. / Hansen, D. M.

Carrier Lifetime Analysis by Microwave Photoconductive Decay (mu-PCD) for 4H SiC Epitaxial Wafers

Chung, G. Y. / Loboda, M. J. / MacMillan, M. F. / Wan, J. W. / Hansen, D. M.

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Check availability in my library

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Document information

Title:

Carrier Lifetime Analysis by Microwave Photoconductive Decay (mu-PCD) for 4H SiC Epitaxial Wafers

Contributors:

Chung, G. Y. (author) / Loboda, M. J. (author) / MacMillan, M. F. (author) / Wan, J. W. (author) / Hansen, D. M. (author) / Wright, N. / Johnson, C. M. / Vassilevski, K. / Nikitina, I. / Horsfall, A.

Published in:

Silicon Carbide and Related Materials 2006 ; 323-326

MATERIALS SCIENCE FORUM ; 556/557

Publication date:

2007-01-01

Size:

4 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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