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Short channel effect improved strained-Si:C-source/drain PMOSFETs
Short channel effect improved strained-Si:C-source/drain PMOSFETs
Short channel effect improved strained-Si:C-source/drain PMOSFETs
Lee, M. H. (Autor:in) / Chang, S. T. (Autor:in) / Maikap, S. (Autor:in) / Shen, K. W. (Autor:in) / Wang, W. C. (Autor:in)
APPLIED SURFACE SCIENCE ; 254 ; 6144-6146
01.01.2008
3 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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