Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Electromigration-induced Pb and Sn whisker growth in SnPb solder stripes
JOURNAL OF MATERIALS RESEARCH -PITTSBURGH THEN WARRENDALE- ; 23 ; 2017-2022
01.01.2008
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Microstructure evolution during electromigration in eutectic SnPb solder bumps
British Library Online Contents | 2004
|Electromigration at the high-Pb-eutectic SnPb solder interface
British Library Online Contents | 2004
|Electromigration induced microstructure and morphological changes in eutectic SnPb solder joints
British Library Online Contents | 2007
|Electromigration-induced Bi-rich whisker growth in Cu/Sn–58Bi/Cu solder joints
British Library Online Contents | 2010
|British Library Online Contents | 2005
|