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Damages and microstructural variation of high-lead and eutectic SnPb composite flip chip solder bumps induced by electromigration
Damages and microstructural variation of high-lead and eutectic SnPb composite flip chip solder bumps induced by electromigration
Damages and microstructural variation of high-lead and eutectic SnPb composite flip chip solder bumps induced by electromigration
Liu, Y.-H. (Autor:in) / Lin, K.-L. (Autor:in)
JOURNAL OF MATERIALS RESEARCH -PITTSBURGH THEN WARRENDALE- ; 20 ; 2184-2193
01.01.2005
10 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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