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Wet cleaning and surface characterization of Si1-xGex virtual substrates after a CMP step
Wet cleaning and surface characterization of Si1-xGex virtual substrates after a CMP step
Wet cleaning and surface characterization of Si1-xGex virtual substrates after a CMP step
Abbadie, A. (Autor:in) / Hartmann, J. M. (Autor:in) / Besson, P. (Autor:in) / Rouchon, D. (Autor:in) / Martinez, E. (Autor:in) / Holliger, P. (Autor:in) / Di Nardo, C. (Autor:in) / Campidelli, Y. (Autor:in) / Billon, T. (Autor:in)
APPLIED SURFACE SCIENCE ; 254 ; 6793-6798
01.01.2008
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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