Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Molecular depth profiling and imaging using cluster ion beams with femtosecond laser postionization
Molecular depth profiling and imaging using cluster ion beams with femtosecond laser postionization
Molecular depth profiling and imaging using cluster ion beams with femtosecond laser postionization
Willingham, D. (Autor:in) / Kucher, A. (Autor:in) / Winograd, N. (Autor:in)
APPLIED SURFACE SCIENCE ; 255 ; 831-833
01.01.2008
3 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
| British Library Online Contents | 2008
Factorial analysis of cluster-SIMS depth profiling using metal-cluster-complex ion beams
| British Library Online Contents | 2008
7.87eV postionization of peptides containing tryptophan or derivatized with fluorescein
| British Library Online Contents | 2006
Molecular depth profiling of trehalose using a C60 cluster ion beam
| British Library Online Contents | 2008
Molecular depth profiling of multi-layer systems with cluster ion sources
| British Library Online Contents | 2006