Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Molecular depth profiling of trehalose using a C60 cluster ion beam
Molecular depth profiling of trehalose using a C60 cluster ion beam
Molecular depth profiling of trehalose using a C60 cluster ion beam
Wucher, A. (Autor:in) / Cheng, J. (Autor:in) / Winograd, N. (Autor:in)
APPLIED SURFACE SCIENCE ; 255 ; 959-961
01.01.2008
3 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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