Molecular depth profiling and imaging using cluster ion beams with femtosecond laser postionization

Willingham, D. / Kucher, A. / Winograd, N. | British Library Online Contents | 2008

Depth Profiling of Thin TiSi~x-Films on Silicon Carbide by SNMS

Getto, R. / Freytag, J. / Kopnarski, M. et al. | British Library Online Contents | 1998

Resonant laser-SNMS of boron for analysis of paleoceanographic samples

Vering, G. / Crone, C. / Kathers, P. et al. | British Library Online Contents | 2006

Depth profiling of electrically non-conductive layered samples by RF-GDOES and HFM plasma SNMS

Hodoroaba, V. D. / Unger, W. E. / Jenett, H. et al. | British Library Online Contents | 2001

State selective detection of sputtered Al neutrals by resonant laser ionization SNMS

Hayashi, S. / Kubota, N. | British Library Online Contents | 2008