Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Development of a high lateral resolution TOF-SIMS apparatus for single particle analysis
Development of a high lateral resolution TOF-SIMS apparatus for single particle analysis
Development of a high lateral resolution TOF-SIMS apparatus for single particle analysis
Sakamoto, T. (Autor:in) / Koizumi, M. (Autor:in) / Kawasaki, J. (Autor:in) / Yamaguchi, J. (Autor:in)
APPLIED SURFACE SCIENCE ; 255 ; 1617-1620
01.01.2008
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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