A platform for research: civil engineering, architecture and urbanism
Development of a high lateral resolution TOF-SIMS apparatus for single particle analysis
Development of a high lateral resolution TOF-SIMS apparatus for single particle analysis
Development of a high lateral resolution TOF-SIMS apparatus for single particle analysis
Sakamoto, T. (author) / Koizumi, M. (author) / Kawasaki, J. (author) / Yamaguchi, J. (author)
APPLIED SURFACE SCIENCE ; 255 ; 1617-1620
2008-01-01
4 pages
Article (Journal)
English
DDC:
621.35
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
British Library Online Contents | 2004
|High resolution static SIMS imaging by time of flight SIMS
British Library Online Contents | 2003
|SIMS and high-resolution RBS analysis of ultrathin SiOxNy films
British Library Online Contents | 2003
|A novel ToF-SIMS operation mode for sub 100nm lateral resolution: Application and performance
British Library Online Contents | 2014
|High-resolution primary ion beam probe for SIMS
British Library Online Contents | 2004
|