Deep Traps in High-Purity Semi-Insulating 6H-SiC Substrates: Thermally Stimulated Current Spectroscopy

Fang, Z. Q. / Claflin, B. / Look, D. C. et al. | British Library Online Contents | 2006

Determination of Intrinsic Defects in High-Purity Semi-Insulating 4H-SiC by Discharge Current Transient Spectroscopy

Matsuura, H. / Takahashi, M. / Kagawa, Y. et al. | British Library Online Contents | 2009

Effects of Sacrificial Oxidation on Characterization of Defects in High-Purity Semi-Insulating 4H-SiC by Discharge Current Transient Spectroscopy

Nishikawa, S. / Okada, R. / Matsuura, H. | British Library Online Contents | 2012

Complementarity of capacitance transient spectroscopy and drain current transient spectroscopy to detect traps in HEMTs

Dermoul, I. / Chekir, F. / Ben Salem, M. et al. | British Library Online Contents | 2002

Investigation of traps in AlGaN/GaN HEMTs by current transient spectroscopy

Gassoumi, M. / Bluet, J. M. / Chekir, F. et al. | British Library Online Contents | 2006