Effects of Sacrificial Oxidation on Characterization of Defects in High-Purity Semi-Insulating 4H-SiC by Discharge Current Transient Spectroscopy: Fid-Bau Portal

Effects of Sacrificial Oxidation on Characterization of Defects in High-Purity Semi-Insulating 4H-SiC by Discharge Current Transient Spectroscopy

Nishikawa, S. / Okada, R. / Matsuura, H.

Zugriff

Zugriff über TIB

Verfügbarkeit in meiner Bibliothek prüfen

Bestellung bei Subito €

Seitennavigation

Dokumentinformationen

Ähnliche Titel

Exportieren, teilen und zitieren

Effects of Sacrificial Oxidation on Characterization of Defects in High-Purity Semi-Insulating 4H-SiC by Discharge Current Transient Spectroscopy

Nishikawa, S. / Okada, R. / Matsuura, H.

Effects of Sacrificial Oxidation on Characterization of Defects in High-Purity Semi-Insulating 4H-SiC by Discharge Current Transient Spectroscopy

Nishikawa, S. / Okada, R. / Matsuura, H.

Zugriff

Zugriff über TIB

Verfügbarkeit in meiner Bibliothek prüfen

Bestellung bei Subito €

Seitennavigation

Dokumentinformationen

Ähnliche Titel

Exportieren, teilen und zitieren

Dokumentinformationen

Titel:

Effects of Sacrificial Oxidation on Characterization of Defects in High-Purity Semi-Insulating 4H-SiC by Discharge Current Transient Spectroscopy

Beteiligte:

Nishikawa, S. (Autor:in) / Okada, R. (Autor:in) / Matsuura, H. (Autor:in)

Erschienen in:

MATERIALS SCIENCE FORUM ; 717/720 ; 271-274

Erscheinungsdatum:

01.01.2012

Format / Umfang:

4 pages

ISSN:

0255-5476

Medientyp:

Aufsatz (Zeitschrift)

Format:

Sprache:

Englisch

Klassifikation:

DDC: 620.11

Matsuura, H. / Takahashi, M. / Kagawa, Y. et al. | British Library Online Contents | 2009

Defects in High-Purity Semi-Insulating SiC

Son, N. T. / Magnusson, B. / Zolnai, Z. et al. | British Library Online Contents | 2004

Characterization of Traps in Semi-Insulating 4H-SiC by Discharge Current Transient Spectroscopy

Takahashi, M. / Matsuura, H. | British Library Online Contents | 2009

Deep Traps in High-Purity Semi-Insulating 6H-SiC Substrates: Thermally Stimulated Current Spectroscopy

Fang, Z. Q. / Claflin, B. / Look, D. C. et al. | British Library Online Contents | 2006

Defect Levels in High Purity Semi-Insulating 4H-SiC Studied by Alpha Particle Induced Charge Transient Spectroscopy

Iwamoto, N. / Onoda, S. / Fujita, N. et al. | British Library Online Contents | 2014

Nach oben