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Impact of 4H-SiC Substrate Defectivity on Epilayer Injected Carrier Lifetimes
Impact of 4H-SiC Substrate Defectivity on Epilayer Injected Carrier Lifetimes
Impact of 4H-SiC Substrate Defectivity on Epilayer Injected Carrier Lifetimes
Ward, R.L.M. (Autor:in) / Lew, K.K. (Autor:in) / Van Mil, B.L. (Autor:in) / Stahlbush, R.E. (Autor:in) / Liu, K.X. (Autor:in) / Caldwell, J.D. (Autor:in) / Klein, P.B. (Autor:in) / Wu, P. (Autor:in) / Fatemi, M. (Autor:in) / Eddy, C.R. (Autor:in)
MATERIALS SCIENCE FORUM ; 600/603 ; 481-484
01.01.2009
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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