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Impact of 4H-SiC Substrate Defectivity on Epilayer Injected Carrier Lifetimes
Impact of 4H-SiC Substrate Defectivity on Epilayer Injected Carrier Lifetimes
Impact of 4H-SiC Substrate Defectivity on Epilayer Injected Carrier Lifetimes
Ward, R.L.M. (author) / Lew, K.K. (author) / Van Mil, B.L. (author) / Stahlbush, R.E. (author) / Liu, K.X. (author) / Caldwell, J.D. (author) / Klein, P.B. (author) / Wu, P. (author) / Fatemi, M. (author) / Eddy, C.R. (author)
MATERIALS SCIENCE FORUM ; 600/603 ; 481-484
2009-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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