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Characterization of 4H-SiC Junction Barrier Schottky Diodes by Admittance vs Temperature Analyses
Characterization of 4H-SiC Junction Barrier Schottky Diodes by Admittance vs Temperature Analyses
Characterization of 4H-SiC Junction Barrier Schottky Diodes by Admittance vs Temperature Analyses
Raynaud, C. (Autor:in) / Nguyen, D.M. (Autor:in) / Brosselard, P. (Autor:in) / Perez-Tomas, A. (Autor:in) / Planson, D. (Autor:in) / Millan, J. (Autor:in)
MATERIALS SCIENCE FORUM ; 615/617 ; 671-674
01.01.2009
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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