EBIC studies of grain boundaries

Holt, D. B. / Raza, B. / Wojcik, A. | British Library Online Contents | 1996

Conventional EBIC versus MOS/EBIC study of electrically active defects in Si and SOI

Bondarenko, I. / Kirk, H. / Kononchuk, O. et al. | British Library Online Contents | 1996

Failure analysis of heavily proton irradiated p^+-n InGaP solar cells by EBIC and cathodoluminescence

Romero, M.J. / Walters, R.J. / Araujo, D. et al. | British Library Online Contents | 1999

SCH laser recombination rate from EBIC profiles

Romero, M. J. / Araujo, D. / Garcia, R. | British Library Online Contents | 1996

Correlation of EBIC and SWBXT Imaged Defects and Epilayer Growth Pits in 6H-SiC Schottky Diodes

Schnabel, C. M. / Tabib-Azar, M. / Neudeck, P. G. et al. | British Library Online Contents | 2000