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    EBIC Analysis of Breakdown Failure Point in 4H-SiC PiN Diodes

    New search for: Ohyanagi, T.
    New search for: Bin, C.
    New search for: Sekiguchi, T.
    New search for: Yamaguchi, H.
    New search for: Matsuhata, H.

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    EBIC Analysis of Breakdown Failure Point in 4H-SiC PiN Diodes

    New search for: Ohyanagi, T.
    New search for: Bin, C.
    New search for: Sekiguchi, T.
    New search for: Yamaguchi, H.
    New search for: Matsuhata, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    EBIC Analysis of Breakdown Failure Point in 4H-SiC PiN Diodes

    New search for: Ohyanagi, T.
    New search for: Bin, C.
    New search for: Sekiguchi, T.
    New search for: Yamaguchi, H.
    New search for: Matsuhata, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    EBIC Analysis of Breakdown Failure Point in 4H-SiC PiN Diodes

    Contributors:

    Ohyanagi, T. (author) / Bin, C. (author) / Sekiguchi, T. (author) / Yamaguchi, H. (author) / Matsuhata, H. (author)

    Published in:

    MATERIALS SCIENCE FORUM ; 615/617 ; 707-710

    Publication date:

    2009-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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