Junction Barrier Schottky Diodes in 4H-SiC and 6H-SiC

Dahlquist, F. / Zetterling, C.-M. / Oestling, M. et al. | British Library Online Contents | 1998

High Voltage Silicon Carbide Schottky Diodes with Single Zone Junction Termination Extension

Vassilevski, K. / Nikitina, I. / Horsfall, A. et al. | British Library Online Contents | 2007

Mechanism Of Deep Penetration Of Plasma-induced Defects In GaAs: Minority Carrier Injection Effect

Nakanishi, H. / Wada, K. | British Library Online Contents | 1995

Characterization of 4H-SiC Junction Barrier Schottky Diodes by Admittance vs Temperature Analyses

Raynaud, C. / Nguyen, D.M. / Brosselard, P. et al. | British Library Online Contents | 2009

Lifetime Control of the Minority Carrier in PiN Diodes by He^+ Ion Implantation

Tanaka, Y. / Kojima, K. / Takao, K. et al. | British Library Online Contents | 2005