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Lifetime Control of the Minority Carrier in PiN Diodes by He^+ Ion Implantation
Lifetime Control of the Minority Carrier in PiN Diodes by He^+ Ion Implantation
Lifetime Control of the Minority Carrier in PiN Diodes by He^+ Ion Implantation
Tanaka, Y. (Autor:in) / Kojima, K. (Autor:in) / Takao, K. (Autor:in) / Okamoto, M. (Autor:in) / Kawasaki, M. (Autor:in) / Takatsuka, A. (Autor:in) / Yatsuo, T. (Autor:in) / Arai, K. (Autor:in) / Nipoti, R. / Poggi, A.
01.01.2005
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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