Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Single Shockley Stacking Faults in As-Grown 4H-SiC Epilayers
Single Shockley Stacking Faults in As-Grown 4H-SiC Epilayers
Single Shockley Stacking Faults in As-Grown 4H-SiC Epilayers
Hassan, J. (Autor:in) / Bergman, J.P. (Autor:in) / Bauer, A.J. / Friedrichs, P. / Krieger, M. / Pensl, G. / Rupp, R. / Seyller, T.
01.01.2010
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
In-Grown Stacking Faults Identified in 4H-SiC Epilayers Grown at High Growth Rate
British Library Online Contents | 2010
|Observation of Shrinking and Reformation of Shockley Stacking Faults by PL Mapping
British Library Online Contents | 2006
|Optical and Structural Properties of In-Grown Stacking Faults in 4H-SiC Epilayers
British Library Online Contents | 2010
|British Library Online Contents | 2010
|Single Shockley Faults Enlargement during Micro-Photoluminescence Defects Mapping
British Library Online Contents | 2010
|