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Optical and Structural Properties of In-Grown Stacking Faults in 4H-SiC Epilayers
Optical and Structural Properties of In-Grown Stacking Faults in 4H-SiC Epilayers
Optical and Structural Properties of In-Grown Stacking Faults in 4H-SiC Epilayers
Hassan, J. (Autor:in) / Henry, A. (Autor:in) / Bergman, J.P. (Autor:in) / Bauer, A.J. / Friedrichs, P. / Krieger, M. / Pensl, G. / Rupp, R. / Seyller, T.
01.01.2010
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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