Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
On the temperature dependence of Na migration in thin SiO2 films during ToF-SIMS O2^+ depth profiling
On the temperature dependence of Na migration in thin SiO2 films during ToF-SIMS O2^+ depth profiling
On the temperature dependence of Na migration in thin SiO2 films during ToF-SIMS O2^+ depth profiling
Krivec, S. (Autor:in) / Detzel, T. (Autor:in) / Buchmayr, M. (Autor:in) / Hutter, H. (Autor:in)
APPLIED SURFACE SCIENCE ; 257 ; 25-32
01.01.2010
8 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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