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On the temperature dependence of Na migration in thin SiO2 films during ToF-SIMS O2^+ depth profiling
On the temperature dependence of Na migration in thin SiO2 films during ToF-SIMS O2^+ depth profiling
On the temperature dependence of Na migration in thin SiO2 films during ToF-SIMS O2^+ depth profiling
Krivec, S. (author) / Detzel, T. (author) / Buchmayr, M. (author) / Hutter, H. (author)
APPLIED SURFACE SCIENCE ; 257 ; 25-32
2010-01-01
8 pages
Article (Journal)
English
DDC:
621.35
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