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Fabrication of Nano-Grating by Focused Ion Beam / Scanning Electron Microscopy Dual-Beam System
Fabrication of Nano-Grating by Focused Ion Beam / Scanning Electron Microscopy Dual-Beam System
Fabrication of Nano-Grating by Focused Ion Beam / Scanning Electron Microscopy Dual-Beam System
Yao, B.Y. (author) / Luo, H. (author) / Feng, L.S. (author) / Zhou, Z. (author) / Wang, R.M. (author) / Chi, Y.Y. (author)
KEY ENGINEERING MATERIALS ; 483 ; 66-69
2011-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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