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Microstructural Evolution of Nanoindented Ag/Si Thin-Film under Different Annealing Temperatures
Microstructural Evolution of Nanoindented Ag/Si Thin-Film under Different Annealing Temperatures
Microstructural Evolution of Nanoindented Ag/Si Thin-Film under Different Annealing Temperatures
Lee, W.-S. (Autor:in) / Chen, T.-H. (Autor:in) / Lin, C.-F. (Autor:in) / Wu, C.-L. (Autor:in)
MATERIALS TRANSACTIONS ; 52 ; 1868-1875
01.01.2011
8 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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