Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Microstructural Evolution of Nanoindented Ag/Si Thin-Film under Different Annealing Temperatures

    New search for: Lee, W.-S.
    New search for: Chen, T.-H.
    New search for: Lin, C.-F.
    New search for: Wu, C.-L.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Microstructural Evolution of Nanoindented Ag/Si Thin-Film under Different Annealing Temperatures

    New search for: Lee, W.-S.
    New search for: Chen, T.-H.
    New search for: Lin, C.-F.
    New search for: Wu, C.-L.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Microstructural Evolution of Nanoindented Ag/Si Thin-Film under Different Annealing Temperatures

    New search for: Lee, W.-S.
    New search for: Chen, T.-H.
    New search for: Lin, C.-F.
    New search for: Wu, C.-L.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Microstructural Evolution of Nanoindented Ag/Si Thin-Film under Different Annealing Temperatures

    Contributors:

    Lee, W.-S. (author) / Chen, T.-H. (author) / Lin, C.-F. (author) / Wu, C.-L. (author)

    Published in:

    MATERIALS TRANSACTIONS ; 52 ; 1868-1875

    Publication date:

    2011-01-01

    Size:

    8 pages

    ISSN:

    1345-9678

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Dependence of Microstructural Evolution of Nanoindented Cu/Si Thin Films on Annealing Temperature

    Lee, W.-S. / Chen, T.-H. / Lin, C.-F. et al. | British Library Online Contents | 2010

    Lateral and vertical size effects on nanoindented microstructures

    Wang, T. H. / Fang, T. H. | British Library Online Contents | 2009

    Atomistic modeling of dislocation activity in nanoindented GaAs

    Jian, S. R. / Fang, T. H. / Chuu, D. S. et al. | British Library Online Contents | 2006

    Effect of nitrogen flow ratio on the microstructure evolution and nanoindented mechanical property of the Ta-Si-N thin films

    Chung, C.K. / Chen, T.S. | British Library Online Contents | 2008

    Giant pop-ins in nanoindented silicon and germanium caused by lateral cracking

    Oliver, D.J. / Lawn, B.R. / Cook, R.F. et al. | British Library Online Contents | 2008

    Back to top