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Characterization of Zr-Si-N films deposited by cathodic vacuum arc with different N2/SiH4 flow rates
Characterization of Zr-Si-N films deposited by cathodic vacuum arc with different N2/SiH4 flow rates
Characterization of Zr-Si-N films deposited by cathodic vacuum arc with different N2/SiH4 flow rates
Zhang, G. P. (Autor:in) / Niu, E. W. (Autor:in) / Wang, X. Q. (Autor:in) / Lv, G. H. (Autor:in) / Zhou, L. (Autor:in) / Pang, H. (Autor:in) / Huang, J. (Autor:in) / Chen, W. (Autor:in) / Yang, S. Z. (Autor:in)
APPLIED SURFACE SCIENCE ; 258 ; 3674-3678
01.01.2012
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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