High-Resolution Topography Analysis on Threading Edge Dislocations in 4H-SiC Epilayers

Kamata, I. / Nagano, M. / Tsuchida, H. et al. | British Library Online Contents | 2009

Characterization of Basal Plane Dislocations in 4H-SiC Substrates by Topography Analysis of Threading Edge Dislocations in Epilayers

Kamata, I. / Nagano, M. / Tsuchida, H. | British Library Online Contents | 2010

Complex Behavior of Threading Dislocations Observed in PVT-Grown 4H-SiC Single Crystals

Katsuno, M. / Fujimoto, T. / Yashiro, H. et al. | British Library Online Contents | 2012

X-Ray Three-Dimensional Topography Imaging of Basal-Plane and Threading-Edge Dislocations in 4H-SiC

Tanuma, R. / Mori, D. / Kamata, I. et al. | British Library Online Contents | 2012

A finite element study of threading dislocations

Stigh, U. | British Library Online Contents | 1993